Dr. Qinwei Ma
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | June 22, 2013
Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
KEYWORDS: Infrared sensors, Speckle, Cameras, Error analysis, Digital cameras, CCD cameras, Digital image correlation, Charge-coupled devices, Environmental sensing, Temperature metrology

PROCEEDINGS ARTICLE | November 18, 2011
Proc. SPIE. 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
KEYWORDS: Cameras, Calibration, Image processing, Inspection, Semiconductor lasers, 3D metrology, Projection systems, Stereo vision systems, 3D image processing, Diffraction gratings

PROCEEDINGS ARTICLE | November 11, 2010
Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications
KEYWORDS: Thermography, Sensors, Image processing, Error analysis, CCD cameras, Electronic components, Image sensors, Charge-coupled devices, CCD image sensors, Temperature metrology

PROCEEDINGS ARTICLE | November 11, 2010
Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications
KEYWORDS: Digital image processing, Imaging systems, Calibration, Image processing, Computing systems, Image resolution, Semiconductor lasers, CCD cameras, Digital imaging, CCD image sensors

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