Qunfen Qi
at Huazhong Univ of Science and Technology
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | December 28, 2010
Proc. SPIE. 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Metrology, 3D imaging standards, Data modeling, Data storage, Manufacturing, System integration, Tolerancing, Systems modeling, Global Positioning System, Standards development

PROCEEDINGS ARTICLE | January 12, 2009
Proc. SPIE. 7133, Fifth International Symposium on Instrumentation Science and Technology

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