Dr. Radek Lapkiewicz
at Univ of Warsaw
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 March 2019
Proc. SPIE. 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
KEYWORDS: Microscopy, Sensors, Signal to noise ratio, Image enhancement, Point spread functions, Confocal microscopy, Diffraction, Image resolution, Super resolution, Single photon

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