Rafael Lemuz-Lopez
at INAOE
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 April 2001
Proc. SPIE. 4301, Machine Vision Applications in Industrial Inspection IX
KEYWORDS: Holograms, Light emitting diodes, Cameras, Image processing, Distortion, Image analysis, Image registration, Diffusers, Visual system, Information visualization

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