Raghu Kokku
Research Scientist at GE Global Research
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Speckle, Scattering, Sensors, Light scattering, Inspection, Laser scattering, 3D modeling, Feature extraction, 3D metrology, 3D image processing

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