Rahil Daman
at Arak Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 May 2008
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: MATLAB, Moire patterns, Calibration, Error analysis, Physics, Image quality, Data processing, Lab on a chip, Neodymium, Imaging arrays

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top