Dr. Rainer Minixhofer
at ams-OSRAM AG
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 20 August 2015 Paper
Lukas Elsinger, Peter Hadley, Rainer Minixhofer, Anderson Singulani
Proceedings Volume 9556, 95560O (2015) https://doi.org/10.1117/12.2187784
KEYWORDS: Lens design, Polarization, Imaging devices, Refractive index, Silicon, Sapphire, Optical design, Scattering, Infrared sensors, Transmittance

Proceedings Article | 16 March 2015 Paper
Proceedings Volume 9357, 93571O (2015) https://doi.org/10.1117/12.2079022
KEYWORDS: Particles, Photodiodes, Back end of line, Surface roughness, Optical spheres, Diodes, Dielectrics, Monte Carlo methods, Semiconducting wafers, Scanning electron microscopy

Proceedings Article | 16 September 2014 Paper
A. Kraxner, F. Roger, B. Loeffler, M. Faccinelli, S. Kirnstoetter, R. Minixhofer, P. Hadley
Proceedings Volume 9236, 923607 (2014) https://doi.org/10.1117/12.2066124
KEYWORDS: Electron beams, Doping, Diodes, Diffusion, Photodiodes, Scanning electron microscopy, TCAD, Optical simulations, Computer simulations, Optical testing

Proceedings Article | 22 May 2013 Paper
A. Kraxner, E. Wachmann, I. Jonak-Auer, J. Teva, J. M. Park, R. Minixhofer
Proceedings Volume 8767, 87670P (2013) https://doi.org/10.1117/12.2017540
KEYWORDS: Doping, Diffusion, Photodiodes, Quantum efficiency, Diodes, Standards development, Optical filters, Silicon, Surface plasmons, CMOS technology

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