Prof. Rainer Tutsch
at Technische Univ Braunschweig
SPIE Involvement:
Conference Co-Chair | Editor | Author
Publications (22)

SPIE Journal Paper | 3 March 2020
OE Vol. 59 Issue 03
KEYWORDS: Modulation transfer functions, Sensors, Monte Carlo methods, Lenses, Spatial frequencies, Cameras, Error analysis, Collimators, Optical engineering, Tolerancing

Proceedings Article | 5 May 2012
Proc. SPIE. 8430, Optical Micro- and Nanometrology IV
KEYWORDS: Gold, Confocal microscopy, Refractive index, Optical sensors, Silica, Interferometers, Silicon, Optical testing, Photoresist materials, Aluminum

SPIE Journal Paper | 1 October 2011
OE Vol. 50 Issue 10
KEYWORDS: Cameras, 3D metrology, Sensors, Imaging systems, Binary data, Mirrors, Projection systems, Raster graphics, Illumination engineering, Photogrammetry

Proceedings Article | 27 May 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Microlens array, Sensors, Silicon, Wavefront sensors, Microlens, Charge-coupled devices, Optical alignment, CCD image sensors, Semiconducting wafers, Signal detection

Proceedings Article | 14 May 2010
Proc. SPIE. 7726, Optical Sensing and Detection
KEYWORDS: Modulation, Imaging systems, Cameras, Calibration, Electrodes, Glasses, Molecules, Manufacturing, LCDs, Projection systems

Showing 5 of 22 publications
Proceedings Volume Editor (8)

SPIE Conference Volume | 17 November 2008

SPIE Conference Volume | 8 October 2007

SPIE Conference Volume | 12 October 2006

SPIE Conference Volume | 5 December 2005

Showing 5 of 8 publications
Conference Committee Involvement (26)
Optical Technology and Measurement for Industrial Applications Conference
22 April 2020 | Yokohama, Japan
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Optical Technology and Measurement for Industrial Applications Conference
23 April 2019 | Yokohama, Japan
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Optical Measurement Systems for Industrial Inspection IX
22 June 2015 | Munich, Germany
Showing 5 of 26 Conference Committees
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