Prof. Rajdeep Singh Rawat
Associate Professor in Physics at National Institute of Education
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 September 2014 Paper
S. M. Kalaiselvi, T. Tan, A. Talebitaher, P. Lee, R. Rawat
Proceedings Volume 9207, 92070P (2014) https://doi.org/10.1117/12.2062549
KEYWORDS: Plasma, X-rays, Neon, X-ray lithography, X-ray sources, Lithography, Inductance, Electrodes, Dielectrics, Aluminum

Conference Committee Involvement (7)
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Showing 5 of 7 Conference Committees
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