Prof. Rajdeep Singh Rawat
Associate Professor in Physics at National Institute of Education
SPIE Involvement:
Conference Program Committee | Author
Publications (1)

Proceedings Article | 5 September 2014
Proc. SPIE. 9207, Advances in X-Ray/EUV Optics and Components IX
KEYWORDS: Lithography, Electrodes, X-rays, X-ray sources, Dielectrics, Aluminum, Neon, X-ray lithography, Inductance, Plasma

Conference Committee Involvement (7)
Advances in Metrology for X-Ray and EUV Optics IX
23 August 2020 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Showing 5 of 7 Conference Committees
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