Dr. Rajesh Ramamurthy
Mechanical Engineer at GE Global Research
SPIE Involvement:
Conference Program Committee | Author
Publications (7)

Proceedings Article | 14 May 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Visualization, Cameras, Calibration, Error analysis, Additive manufacturing, Printing, Light sources and illumination, Optical alignment, Optics manufacturing

Proceedings Article | 1 May 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Confocal microscopy, Thin films, Metrology, Reflection, Sensors, Metals, Composites, Laser applications, Inspection, Control systems, Optical testing, Colorimetry, Optical metrology, Process control, Specular reflections, Optical resolution, Tolerancing

Proceedings Article | 1 May 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Confocal microscopy, Phase shifting, Metrology, Transparency, Reflection, Imaging systems, Sensors, Metals, Glasses, Manufacturing, Colorimetry, 3D metrology, Surface finishing, Phase shifts, Structured light

Proceedings Article | 19 May 2016
Proc. SPIE. 9868, Dimensional Optical Metrology and Inspection for Practical Applications V
KEYWORDS: Signal to noise ratio, Optical filters, Metrology, Lithium, Light emitting diodes, Optical sensors, Polarization, Reflection, Speckle, Interferometers, Cameras, Sensors, Inspection, Reflectivity, Semiconductor lasers, 3D metrology, Projection systems, Neodymium, 3D vision, Structured light

Proceedings Article | 19 May 2015
Proc. SPIE. 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV
KEYWORDS: Optical sensors, Sensors, Inspection, Clouds, 3D modeling, Feature extraction, Optical testing, 3D metrology, Computer aided design, Tolerancing

Proceedings Article | 14 May 2015
Proc. SPIE. 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV
KEYWORDS: Confocal microscopy, Microscopes, Phase shifting, Imaging systems, Sensors, Microscopy, Manufacturing, Computed tomography, Associative arrays, Structured light

Showing 5 of 7 publications
Conference Committee Involvement (1)
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
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