Prof. Rajpal S. Sirohi
Professor at Alabama A&M Univ
SPIE Involvement:
Education Committee | Membership & Communities Committee | Fellow status | Conference Program Committee | Journal Editorial Board Member | Author | Editor
Publications (41)

SPIE Journal Paper | August 16, 2013
OE Vol. 52 Issue 08
KEYWORDS: Fourier transforms, Holography, Multiplexing, Interferometers, Holographic interferometry, Lenses, Wavefronts, Collimation, Monochromatic aberrations, Optical engineering

PROCEEDINGS ARTICLE | October 12, 2006
Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV
KEYWORDS: Fringe analysis, Polarization, Interferometers, Polarizers, Wave plates, Phase interferometry, Optical interferometry, Jones calculus, Circular polarizers, Phase shifts

PROCEEDINGS ARTICLE | March 7, 2006
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Fringe analysis, Phase shifting, Polarization, Speckle, Sensors, Photography, Nondestructive evaluation, Speckle interferometry, Charge-coupled devices, Liquids

PROCEEDINGS ARTICLE | March 7, 2006
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Beam splitters, Phase shifting, Ferroelectric materials, Polarization, Interferometers, Fourier transforms, Interferometry, Phase interferometry, Optical interferometry, Phase shifts

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Refractive index, Fringe analysis, Speckle, Image processing, Crystals, Photography, Semiconductor lasers, Speckle pattern, Laser crystals, Crystallography

PROCEEDINGS ARTICLE | August 30, 2002
Proc. SPIE. 4924, Holography, Diffractive Optics, and Applications
KEYWORDS: Photovoltaics, Diffraction, Refractive index, Holograms, Holography, Solar energy, Modulation, Lenses, Solar cells, Volume holography

Showing 5 of 41 publications
Conference Committee Involvement (3)
Optical Measurement Systems for Industrial Inspection IV
13 June 2005 | Munich, Germany
Optical Metrology in Production Engineering
27 April 2004 | Strasbourg, France
Microsystems Engineering: Metrology and Inspection III
23 June 2003 | Munich, Germany
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