Prof. Rajpal S. Sirohi
Professor at Alabama A&M Univ
SPIE Involvement:
Education Committee | Membership & Communities Committee | Fellow status | Conference Program Committee | Journal Editorial Board Member | Author | Editor
Publications (41)

SPIE Journal Paper | August 16, 2013
OE Vol. 52 Issue 08
KEYWORDS: Fourier transforms, Holography, Multiplexing, Interferometers, Holographic interferometry, Lenses, Wavefronts, Collimation, Monochromatic aberrations, Optical engineering

PROCEEDINGS ARTICLE | October 12, 2006
Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV
KEYWORDS: Phase shifts, Interferometers, Wave plates, Polarization, Circular polarizers, Optical interferometry, Jones calculus, Polarizers, Phase interferometry, Fringe analysis

PROCEEDINGS ARTICLE | March 7, 2006
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Speckle interferometry, Phase shifting, Polarization, Speckle, Photography, Nondestructive evaluation, Fringe analysis, Sensors, Liquids, Charge-coupled devices

PROCEEDINGS ARTICLE | March 7, 2006
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Phase shifts, Ferroelectric materials, Polarization, Phase shifting, Optical interferometry, Phase interferometry, Interferometers, Beam splitters, Interferometry, Fourier transforms

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Crystals, Speckle, Photography, Laser crystals, Speckle pattern, Crystallography, Fringe analysis, Refractive index, Semiconductor lasers, Image processing

PROCEEDINGS ARTICLE | August 30, 2002
Proc. SPIE. 4924, Holography, Diffractive Optics, and Applications
KEYWORDS: Holograms, Holography, Lenses, Diffraction, Solar cells, Volume holography, Solar energy, Modulation, Refractive index, Photovoltaics

Showing 5 of 41 publications
Conference Committee Involvement (3)
Optical Measurement Systems for Industrial Inspection IV
13 June 2005 | Munich, Germany
Optical Metrology in Production Engineering
27 April 2004 | Strasbourg, France
Microsystems Engineering: Metrology and Inspection III
23 June 2003 | Munich, Germany
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