Prof. Rajpal S. Sirohi
Professor at Alabama A&M Univ
SPIE Involvement:
Editorial Board Member: Optical Engineering | Author | Editor
Publications (42)

SPIE Journal Paper | 30 April 2020
OE Vol. 59 Issue 04
KEYWORDS: Collimation, Interferometry, Interferometers, Mirrors, Prisms, Fringe analysis, Diffraction, Optical engineering, Composites, Spherical lenses

SPIE Journal Paper | 16 August 2013
OE Vol. 52 Issue 08
KEYWORDS: Fourier transforms, Holography, Multiplexing, Interferometers, Holographic interferometry, Lenses, Wavefronts, Collimation, Monochromatic aberrations, Optical engineering

Proceedings Article | 12 October 2006 Paper
Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV
KEYWORDS: Fringe analysis, Polarization, Interferometers, Polarizers, Wave plates, Phase interferometry, Optical interferometry, Jones calculus, Circular polarizers, Phase shifts

Proceedings Article | 7 March 2006 Paper
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Beam splitters, Phase shifting, Ferroelectric materials, Polarization, Interferometers, Fourier transforms, Interferometry, Phase interferometry, Optical interferometry, Phase shifts

Proceedings Article | 7 March 2006 Paper
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Fringe analysis, Phase shifting, Polarization, Speckle, Sensors, Photography, Nondestructive evaluation, Speckle interferometry, Charge-coupled devices, Liquids

Showing 5 of 42 publications
Conference Committee Involvement (3)
Optical Measurement Systems for Industrial Inspection IV
13 June 2005 | Munich, Germany
Optical Metrology in Production Engineering
27 April 2004 | Strasbourg, France
Microsystems Engineering: Metrology and Inspection III
23 June 2003 | Munich, Germany
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