CONFERENCE PROCEEDINGS
Advanced Search >
Rakhi Narang
at Univ of Delhi
SPIE Involvement:
Author
Publications (1)
PROCEEDINGS ARTICLE | October 15, 2012
An Analytical Modeling Approach for a Gate All Around (GAA) Tunnel Field Effect Transistor (TFET)
Proc. SPIE. 8549, 16th International Workshop on Physics of Semiconductor Devices
KEYWORDS: Gallium arsenide, Doping, Computer simulations, 3D modeling, Field effect transistors, Analytical research, 3D equipment, Computer architecture, Statistical modeling, Instrument modeling
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Back to Top