Prof. Ralf B. Bergmann
Director at Bremer Institut für angewandte Strahltechnik GmbH
SPIE Involvement:
Senior status | Conference Program Committee | Author
Websites:
Publications (31)

PROCEEDINGS ARTICLE | March 27, 2018
Proc. SPIE. 10599, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XII
KEYWORDS: Digital signal processing, Modulation, Materials processing, Physics, Clouds, Analytical research, Electrical engineering, All optical signal processing, Americium, Tin

SPIE Journal Paper | December 7, 2017
OE Vol. 56 Issue 12
KEYWORDS: Holograms, Digital holography, Speckle, Multiplexing, Cameras, Denoising, Holography, Objectives, Semiconductor lasers, Optical engineering

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Metrology, Light emitting diodes, Sensors, Interferometry, Wavefront sensors, Wavefronts, Optical testing, Spatial light modulators, Aspheric optics, Aspheric lenses, Freeform optics, Optics manufacturing, Shearing interferometers

PROCEEDINGS ARTICLE | May 15, 2017
Proc. SPIE. 10233, Holography: Advances and Modern Trends V
KEYWORDS: Temporal coherence, Holograms, Holography, Medicine, Phase contrast, Digital holography, Scattering, Sensors, Stereoscopy, Remote sensing, Light scattering, Interferometry, Spatial coherence, Phase shifts

PROCEEDINGS ARTICLE | May 15, 2017
Proc. SPIE. 10233, Holography: Advances and Modern Trends V
KEYWORDS: Holograms, Holography, Digital holography, Speckle, Cameras, Denoising, Microscopy, Multiplexing, Optical metrology

PROCEEDINGS ARTICLE | May 15, 2017
Proc. SPIE. 10233, Holography: Advances and Modern Trends V
KEYWORDS: Confocal microscopy, Mirrors, Beam splitters, Light sources, Phase shifting, Holography, Metrology, Digital holography, Cameras, Microscopy, Inspection, Optical testing, Optical inspection, Optical interferometry, Charge-coupled devices

Showing 5 of 31 publications
Conference Committee Involvement (10)
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure X
21 March 2016 | Las Vegas, Nevada, United States
Optical Measurement Systems for Industrial Inspection IX
22 June 2015 | Munich, Germany
Structural Health Monitoring and Inspection of Advanced Materials, Aerospace, and Civil Infrastructure IX
9 March 2015 | San Diego, California, United States
Interferometry XVII: Advanced Applications
19 August 2014 | San Diego, California, United States
Showing 5 of 10 published special sections
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