Prof. Ralf B. Bergmann
at Bremer Institut fuer angewandte Strahltechnik GmbH
SPIE Involvement:
Author
Area of Expertise:
optical metrology , opto-electronic systems , diffractive optics , optical sensors , 3D displays , nano optics
Websites:
Publications (47)

SPIE Journal Paper | 12 July 2024
André Müller, Ralf Bergmann, Claas Falldorf
OE, Vol. 63, Issue 11, 111805, (July 2024) https://doi.org/10.1117/12.10.1117/1.OE.63.11.111805
KEYWORDS: Microscopy, Holograms, Digital holography, Cameras, Holography, Image restoration, Sensors, Diffraction limit, Wave propagation, Light sources and illumination

Proceedings Article | 18 June 2024 Paper
Yann Sperling, Ralf Bergmann
Proceedings Volume 12997, 1299713 (2024) https://doi.org/10.1117/12.3015111
KEYWORDS: Cameras, Image registration, Phase measurement, 3D modeling, Calibration, Data modeling, 3D metrology

Proceedings Article | 15 August 2023 Presentation + Paper
Proceedings Volume 12618, 126180T (2023) https://doi.org/10.1117/12.2673783
KEYWORDS: Light sources and illumination, Light emitting diodes, Light sources, 3D metrology, Cameras, Speckle, Partial coherence, Objectives, LED lighting, Imaging systems

Proceedings Article | 10 August 2023 Presentation + Paper
Ralf Bergmann, Claas Falldorf, Alberto Garcia Ortiz, André Müller, Mostafa Agour, Carsten Bockelmann
Proceedings Volume 12619, 1261902 (2023) https://doi.org/10.1117/12.2675922
KEYWORDS: Compressed sensing, Optical metrology, Optical coherence, Information theory, Interferograms, Cameras, Terahertz radiation, Fourier transform interferometers, Phase reconstruction, Image restoration

SPIE Journal Paper | 10 November 2022
OE, Vol. 61, Issue 11, 114102, (November 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.11.114102
KEYWORDS: Terahertz radiation, Wavefronts, Spherical lenses, Diffraction gratings, Cameras, Diffraction, Wavefront aberrations, Sensors, Interferometers, Monochromatic aberrations

Showing 5 of 47 publications
Conference Committee Involvement (14)
Optical Measurement Systems for Industrial Inspection XIV
26 June 2025 | Munich, Germany
Optical Measurement Systems for Industrial Inspection XIII
26 June 2023 | Munich, Germany
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Online Only, Germany
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Showing 5 of 14 Conference Committees
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