Prof. Ralf B. Bergmann
at Bremer Institut fuer angewandte Strahltechnik GmbH
SPIE Involvement:
Author
Area of Expertise:
optical metrology , opto-electronic systems , diffractive optics , optical sensors , 3D displays , nano optics
Websites:
Publications (45)

Proceedings Article | 15 August 2023 Presentation + Paper
Proceedings Volume 12618, 126180T (2023) https://doi.org/10.1117/12.2673783
KEYWORDS: Light sources and illumination, Light emitting diodes, Light sources, 3D metrology, Cameras, Speckle, Partial coherence, Objectives, LED lighting, Imaging systems

Proceedings Article | 10 August 2023 Presentation + Paper
Ralf Bergmann, Claas Falldorf, Alberto Garcia Ortiz, André Müller, Mostafa Agour, Carsten Bockelmann
Proceedings Volume 12619, 1261902 (2023) https://doi.org/10.1117/12.2675922
KEYWORDS: Compressed sensing, Optical metrology, Optical coherence, Information theory, Interferograms, Cameras, Terahertz radiation, Fourier transform interferometers, Phase reconstruction, Image restoration

SPIE Journal Paper | 10 November 2022
OE, Vol. 61, Issue 11, 114102, (November 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.11.114102
KEYWORDS: Terahertz radiation, Wavefronts, Spherical lenses, Diffraction gratings, Cameras, Diffraction, Wavefront aberrations, Sensors, Interferometers, Monochromatic aberrations

Proceedings Article | 31 May 2022 Presentation + Paper
Proceedings Volume 12134, 121340B (2022) https://doi.org/10.1117/12.2621696
KEYWORDS: Terahertz radiation, Cameras, Wavefronts, Spherical lenses, Diffraction gratings, Diffraction, Wavefront sensors, Sensors, Interferometers, Wave propagation

Proceedings Article | 20 May 2022 Presentation + Paper
André Müller, Claas Falldorf, Ralf Bergmann
Proceedings Volume 12137, 121370L (2022) https://doi.org/10.1117/12.2621647
KEYWORDS: Mars, Light sources, Compressed sensing, Spatial light modulators, Freeform optics, Signal to noise ratio, Fourier transforms, Aspheric optics, Wavefronts, Spatial frequencies, Coherence (optics)

Showing 5 of 45 publications
Conference Committee Involvement (13)
Optical Measurement Systems for Industrial Inspection XIII
26 June 2023 | Munich, Germany
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Online Only, Germany
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure X
21 March 2016 | Las Vegas, Nevada, United States
Showing 5 of 13 Conference Committees
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