Prof. Ralf B. Bergmann
Director at Bremer Institut für angewandte Strahltechnik GmbH
SPIE Involvement:
Senior status | Conference Program Committee | Author
Websites:
Publications (30)

SPIE Journal Paper | December 7, 2017
OE Vol. 56 Issue 12
KEYWORDS: Holograms, Digital holography, Speckle, Multiplexing, Cameras, Denoising, Holography, Objectives, Semiconductor lasers, Optical engineering

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Metrology, Light emitting diodes, Sensors, Interferometry, Wavefront sensors, Wavefronts, Optical testing, Spatial light modulators, Aspheric optics, Aspheric lenses, Freeform optics, Optics manufacturing, Shearing interferometers

PROCEEDINGS ARTICLE | May 15, 2017
Proc. SPIE. 10233, Holography: Advances and Modern Trends V
KEYWORDS: Holograms, Holography, Digital holography, Speckle, Cameras, Denoising, Microscopy, Multiplexing, Optical metrology

PROCEEDINGS ARTICLE | May 15, 2017
Proc. SPIE. 10233, Holography: Advances and Modern Trends V
KEYWORDS: Confocal microscopy, Mirrors, Beam splitters, Light sources, Phase shifting, Holography, Metrology, Digital holography, Cameras, Microscopy, Inspection, Optical testing, Optical inspection, Optical interferometry, Charge-coupled devices

PROCEEDINGS ARTICLE | May 15, 2017
Proc. SPIE. 10233, Holography: Advances and Modern Trends V
KEYWORDS: Temporal coherence, Holograms, Holography, Medicine, Phase contrast, Digital holography, Scattering, Sensors, Stereoscopy, Remote sensing, Light scattering, Interferometry, Spatial coherence, Phase shifts

PROCEEDINGS ARTICLE | March 9, 2016
Proc. SPIE. 9718, Quantitative Phase Imaging II
KEYWORDS: Microelectromechanical systems, Microscopes, Phase contrast, Coherence (optics), Modulation, Sensors, Image processing, Microscopy, Reflectivity, Interferometry, Phase shift keying, Spatial light modulators, Digital image correlation, Wave sensors, Phase measurement, Vibration isolation, Spatial light modulator

Showing 5 of 30 publications
Conference Committee Involvement (10)
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure X
21 March 2016 | Las Vegas, Nevada, United States
Optical Measurement Systems for Industrial Inspection IX
22 June 2015 | Munich, Germany
Structural Health Monitoring and Inspection of Advanced Materials, Aerospace, and Civil Infrastructure IX
9 March 2015 | San Diego, California, United States
Interferometry XVII: Advanced Applications
19 August 2014 | San Diego, California, United States
Showing 5 of 10 published special sections
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