Dr. Ralf D. Geckeler
at Physikalisch-Technische Bundesanstalt
SPIE Involvement:
Conference Program Committee | Author
Publications (24)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Mirrors, Metrology, Calibration, Autocollimators, Optical encoders, Position sensors, Prototyping, Positioning equipment, Precision calibration

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9206, Advances in Metrology for X-Ray and EUV Optics V
KEYWORDS: Mirrors, Metrology, Calibration, Inspection, Computer programming, Optical testing, Head, Autocollimators, Synchrotrons, Optics manufacturing

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8789, Modeling Aspects in Optical Metrology IV
KEYWORDS: Mathematical modeling, Modeling, Reflectors, Metrology, Reflection, Calibration, Manufacturing, Optical testing, Autocollimators, Profilometers

SPIE Journal Paper | July 1, 2011
OE Vol. 50 Issue 07
KEYWORDS: Mirrors, Autocollimators, Optical alignment, Alignment procedures, Error analysis, Ray tracing, Optical engineering, Light sources, Reliability, Computer simulations

SPIE Journal Paper | May 1, 2011
OE Vol. 50 Issue 05
KEYWORDS: Mirrors, Autocollimators, Alignment procedures, Optical alignment, Kinematics, Optical engineering, Spherical lenses, Error analysis, Light sources, Calibration

PROCEEDINGS ARTICLE | September 2, 2010
Proc. SPIE. 7801, Advances in Metrology for X-Ray and EUV Optics III
KEYWORDS: Mirrors, X-ray optics, Calibration, Error analysis, Kinematics, Ray tracing, Autocollimators, Optical alignment, Spherical lenses, Alignment procedures

Showing 5 of 24 publications
Conference Committee Involvement (8)
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics IV
12 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics III
1 August 2010 | San Diego, California, United States
Showing 5 of 8 published special sections
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