Dr. Ralf K. Heilmann
Assoc. Dir. (SNL) /Principal Research Scientist at MIT Kavli Institute for Astrophysics and Space Research
SPIE Involvement:
Profile Summary

Ralf is a Principal Research Scientist at the MIT Kavli Institute for Astrophysics and Space Research (MKI) and the Associate Director of the MIT/MKI Space Nanotechnology Laboratory.
He is the co-inventor of the critical-angle transmission grating technology, which is now ready for implementation in future astrophysics missions (Arcus, Lynx, REDSoX, etc.) with orders-of-magnitude improved performance over the Chandra and XMM-Newton grating instruments. Before MIT he performed phase separation studies on ultra-thin wetting films and investigated the structure of Langmuir monolayers as a postdoc at Harvard. He received his Ph.D. in physics from Carnegie Mellon University for his x-ray studies of the growth dynamics of quench-condensed noble gas films. Ralf has over two decades of experience in lab- and synchrotron-based x-ray scattering and diffraction. He has published over 120 papers in the fields of diffraction gratings, x-ray optics, spectrometer design, stress-based figure correction, optical metrology, x-ray scattering, thin-foil optics, interference lithography, nanofabrication, and mission design.
Publications (107)

Proceedings Article | 10 April 2024 Presentation
Proceedings Volume 12955, 129550Z (2024) https://doi.org/10.1117/12.3010409
KEYWORDS: Diffraction gratings, X-rays, Semiconducting wafers, X-ray diffraction, Metrology, Fabrication, Etching, Spectrometers, Spectral resolution, Reflection

Proceedings Article | 5 October 2023 Presentation + Paper
Proceedings Volume 12679, 126790L (2023) https://doi.org/10.1117/12.2676797
KEYWORDS: Diffraction gratings, Blazed gratings, X-rays, Semiconducting wafers, Diffraction, Silicon, Spectroscopy, Etching

Proceedings Article | 5 October 2023 Presentation + Paper
Mallory Whalen, Ralf Heilmann, Mark Schattenburg
Proceedings Volume 12679, 126790P (2023) https://doi.org/10.1117/12.2677492
KEYWORDS: Coating stress, Thin film coatings, X-rays, Thin films, Film thickness, Mirrors, Silicon, Optical coatings, Measurement devices

Proceedings Article | 5 October 2023 Presentation + Paper
Proceedings Volume 12679, 126790Q (2023) https://doi.org/10.1117/12.2677596
KEYWORDS: Computer generated holography, Optical surfaces, X-ray telescopes, Metrology, Fizeau interferometers, X-rays

Proceedings Article | 5 October 2023 Poster + Paper
Proceedings Volume 12678, 126781D (2023) https://doi.org/10.1117/12.2677455
KEYWORDS: Ultraviolet radiation, Equipment, Charge-coupled devices, X-rays, Spectral resolution, Optical gratings, Simulations, Vignetting, Dispersion

Showing 5 of 107 publications
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