100 μm thick layers of CdTe have been grown by Molecular Beam Epitaxy (MBE) on LEC GaAs (001) substrates. The
intended application for the CdTe thick films is the fabrication of radiation detectors. As recently reported
extensive characterization has been performed. In this paper the results of the previous papers are being summarized,
showing the potential of the CdTe films to be used as radiation detector. Furthermore first investigations on the
application of the layers as radiation detectors are being presented.