Prof. Ralph P. Tatam
Professor (Personal Chair) at Cranfield Univ
SPIE Involvement:
Board of Directors | Publications Committee | Fellow status | Conference Program Committee | Symposium Chair | Conference Chair | Author
Area of Expertise:
Optical fibre sensors , Optical instrumentation , Optical fibre grating sensors , Interferometry , Laser anemometry , Optical gas sensing
Publications (157)

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Mirrors, Beam splitters, Microfluidics, Interferometers, Optical coherence tomography, Particles, Interfaces, Spatial resolution, Velocimetry, Velocity measurements

PROCEEDINGS ARTICLE | May 9, 2018
Proc. SPIE. 10680, Optical Sensing and Detection V
KEYWORDS: Confocal microscopy, Refractive index, Mirrors, Light sources, Reflection, Interferometers, Dispersion, Spectroscopy, Interferometry, Diodes

PROCEEDINGS ARTICLE | May 9, 2018
Proc. SPIE. 10680, Optical Sensing and Detection V
KEYWORDS: Methane, Optical spheres, Speckle, Sensors, Calibration, Spectroscopy, Reflectivity, Absorbance, Integrating spheres, Absorption

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Speckle, Sensors, Manufacturing, Robotics, Control systems, Additive manufacturing, Sensor performance, 3D metrology, Velocimetry, Laser manufacturing, Robotic systems

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Optical fibers, Fiber Bragg gratings, Sensors, Interferometry, Multiplexing, Structured optical fibers, Fiber optics sensors, Vibrometry, Sensing systems, Phase measurement

PROCEEDINGS ARTICLE | May 16, 2017
Proc. SPIE. 10231, Optical Sensors 2017
KEYWORDS: Image processing algorithms and systems, Detection and tracking algorithms, Speckle, Sensors, Image segmentation, Image processing, Robotics, Computer vision technology, Speckle pattern, Data processing, Signal processing, Binary data

Showing 5 of 157 publications
Conference Committee Involvement (11)
Optical Measurement Systems for Industrial Inspection
18 June 2007 | Munich, Germany
Optical Metrology
17 June 2007 | Munich, Germany
Optical Diagnostics
3 August 2005 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection IV
13 June 2005 | Munich, Germany
Optical Metrology
13 June 2005 | Munich, Germany
Showing 5 of 11 published special sections
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