Ramil Minnigazimov
at
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Publications (1)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10334, Automated Visual Inspection and Machine Vision II
KEYWORDS: Photodetectors, Diffraction, Sensors, Error analysis, Wavefront sensors, Wavefronts, Precision measurement, Near field diffraction, Objectives, Measurement devices, Tolerancing, Instrumentation control, Accuracy assessment

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