Mr. Ramon Estaña
at Univ Karlsruhe
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Surface plasmons, Imaging systems, Interferometers, Cameras, Sensors, Calibration, Interferometry, Robots, CCD cameras, Software development

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