Randy F. Crouse
at JENOPTIK Optical Systems, LLC
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | September 26, 2003
Proc. SPIE. 5078, Window and Dome Technologies VIII
KEYWORDS: Antireflective coatings, Electron beams, Etching, Gallium arsenide, Silicon, Coating, Reflectivity, Photoresist materials, Semiconducting wafers, Infrared materials

PROCEEDINGS ARTICLE | July 9, 2003
Proc. SPIE. 4964, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing X
KEYWORDS: Lithography, Eye, Microlens array, Imaging systems, Lenses, Glasses, Photoresist materials, LCDs, Microlens, 3D displays

PROCEEDINGS ARTICLE | January 17, 2003
Proc. SPIE. 4984, Micromachining Technology for Micro-Optics and Nano-Optics
KEYWORDS: Monochromatic aberrations, Point spread functions, Lenses, Wavefront sensors, Wavefronts, Semiconductor lasers, Objectives, Microlens, Phase measurement, Semiconducting wafers

PROCEEDINGS ARTICLE | September 1, 1991
Proc. SPIE. 1488, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing II
KEYWORDS: Point spread functions, Refractive index, Data modeling, Imaging systems, Wavefronts, Image quality, Wave propagation, Modulation transfer functions, Systems modeling, Radio propagation

PROCEEDINGS ARTICLE | October 1, 1990
Proc. SPIE. 1326, Window and Dome Technologies and Materials II
KEYWORDS: Defense and security, Diffraction, Point spread functions, Error analysis, Computer programming, Ray tracing, Modulation transfer functions, Geometrical optics, Aerodynamics, Systems modeling

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