Dr. Ranjan Ramachandra
Associate Development Engineer at Univ of California San Diego
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 March 2008
Proc. SPIE. 6922, Metrology, Inspection, and Process Control for Microlithography XXII
KEYWORDS: Gold, Metrology, Copper, Ions, Silver, Monte Carlo methods, Ion beams, Solids, Aluminum, Helium

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top