Dr. Rashit F. Nabiev
Director at Broadcom Inc
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | February 6, 2010
Proc. SPIE. 7615, Vertical-Cavity Surface-Emitting Lasers XIV
KEYWORDS: Wafer-level optics, Manufacturing, Reliability, Control systems, Process control, Vertical cavity surface emitting lasers, Semiconducting wafers, Optics manufacturing, Wafer testing, Oxidation

PROCEEDINGS ARTICLE | February 23, 2006
Proc. SPIE. 6135, Liquid Crystal Materials, Devices, and Applications XI
KEYWORDS: Speckle, Laser applications, Lamps, Semiconductor lasers, Liquid crystal on silicon, Televisions, Projection systems, Laser video displays, Semiconducting wafers, RGB color model

PROCEEDINGS ARTICLE | August 29, 2002
Proc. SPIE. 4905, Materials and Devices for Optical and Wireless Communications
KEYWORDS: Microelectromechanical systems, Oxides, Eye, Modulation, Reliability, Fiber lasers, Wavelength tuning, Vertical cavity surface emitting lasers, Semiconducting wafers

PROCEEDINGS ARTICLE | April 18, 2000
Proc. SPIE. 3947, In-Plane Semiconductor Lasers IV
KEYWORDS: Packaging, Semiconductors, Quantum wells, Waveguides, Cladding, High power lasers, Reliability, Laser development, Semiconductor lasers, Diodes

PROCEEDINGS ARTICLE | April 1, 1999
Proc. SPIE. 3628, In-Plane Semiconductor Lasers III

PROCEEDINGS ARTICLE | April 1, 1999
Proc. SPIE. 3628, In-Plane Semiconductor Lasers III
KEYWORDS: High power lasers, Gallium arsenide, Reliability, Semiconductor lasers, Solids, Phosphorus, Metalorganic chemical vapor deposition, Arsenic, Molecular beam epitaxy, Indium gallium phosphide

Showing 5 of 9 publications
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