Raúl Fernandez
at Univ Autònoma de Barcelona
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 June 2005
Proc. SPIE. 5837, VLSI Circuits and Systems II
KEYWORDS: Oxides, Oscillators, Reliability, Measurement devices, Transistors, Field effect transistors, Systems modeling, Device simulation, Dielectric breakdown, Instrument modeling

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