Ravi K. Ravikumar
Director Marketing at Takumi Technology Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 May 2007 Paper
Tom Wong, Ravi Ravikumar
Proceedings Volume 6607, 66070P (2007) https://doi.org/10.1117/12.728939
KEYWORDS: System on a chip, Design for manufacturing, Failure analysis, Manufacturing, Optical proximity correction, Critical dimension metrology, Yield improvement, Composites, Logic, Optics manufacturing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top