Dr. Raymond P. Conley
X-Ray Optics Scientist at Argonne National Lab
SPIE Involvement:
Conference Program Committee | Author
Publications (18)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10389, X-Ray Nanoimaging: Instruments and Methods III
KEYWORDS: Gold, X-ray optics, Sputter deposition, X-rays, Interfaces, Image transmission, Charge-coupled devices, Zone plates, Monochromators, Phase shifts

PROCEEDINGS ARTICLE | March 28, 2017
Proc. SPIE. 10145, Metrology, Inspection, and Process Control for Microlithography XXXI
KEYWORDS: Fabrication, Semiconductors, Diffraction, Metrology, Imaging systems, Spatial frequencies, Silicon, Optical fabrication, Scanning electron microscopy, Transmission electron microscopy, Software development, Contrast transfer function

PROCEEDINGS ARTICLE | September 4, 2015
Proc. SPIE. 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII
KEYWORDS: Mirrors, Multilayers, Metrology, Sputter deposition, Glasses, X-rays, Ions, Computer aided design, X-ray astronomy, X-ray telescopes

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9207, Advances in X-Ray/EUV Optics and Components IX
KEYWORDS: Mirrors, Multilayers, X-ray optics, Metrology, Sputter deposition, Ions, Coating, Ion beams, Servomechanisms, Monochromators

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9207, Advances in X-Ray/EUV Optics and Components IX
KEYWORDS: Thin films, Multilayers, X-ray optics, Lenses, Sputter deposition, Interfaces, Silicon, Molybdenum, Hard x-rays, Thin film devices

PROCEEDINGS ARTICLE | October 19, 2012
Proc. SPIE. 8502, Advances in X-Ray/EUV Optics and Components VII
KEYWORDS: Multilayers, X-ray optics, Metrology, Sputter deposition, X-rays, Silicon, Nitrogen, Reflectivity, Control systems, Scanning electron microscopy

Showing 5 of 18 publications
Conference Committee Involvement (9)
Advances in X-Ray/EUV Optics and Components XIII
19 August 2018 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XII
8 August 2017 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XI
31 August 2016 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components X
11 August 2015 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components IX
19 August 2014 | San Diego, California, United States
Showing 5 of 9 published special sections
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top