Dr. Raymond P. Conley
X-Ray Optics Scientist at Argonne National Lab
SPIE Involvement:
Conference Program Committee | Author
Publications (18)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10389, X-Ray Nanoimaging: Instruments and Methods III
KEYWORDS: Gold, Zone plates, Image transmission, X-rays, Phase shifts, Monochromators, Charge-coupled devices, X-ray optics, Interfaces, Sputter deposition

PROCEEDINGS ARTICLE | March 28, 2017
Proc. SPIE. 10145, Metrology, Inspection, and Process Control for Microlithography XXXI
KEYWORDS: Metrology, Imaging systems, Contrast transfer function, Software development, Scanning electron microscopy, Semiconductors, Silicon, Diffraction, Spatial frequencies, Transmission electron microscopy, Optical fabrication, Fabrication

PROCEEDINGS ARTICLE | September 4, 2015
Proc. SPIE. 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII
KEYWORDS: Mirrors, Ions, Multilayers, Metrology, X-ray telescopes, Glasses, X-rays, Computer aided design, X-ray astronomy, Sputter deposition

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9207, Advances in X-Ray/EUV Optics and Components IX
KEYWORDS: Multilayers, Mirrors, Coating, Ions, Sputter deposition, Metrology, Ion beams, X-ray optics, Servomechanisms, Monochromators

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9207, Advances in X-Ray/EUV Optics and Components IX
KEYWORDS: Multilayers, Silicon, Thin films, Molybdenum, Sputter deposition, Hard x-rays, X-ray optics, Lenses, Thin film devices, Interfaces

PROCEEDINGS ARTICLE | October 19, 2012
Proc. SPIE. 8502, Advances in X-Ray/EUV Optics and Components VII
KEYWORDS: Multilayers, Sputter deposition, Nitrogen, Scanning electron microscopy, Silicon, Reflectivity, X-ray optics, X-rays, Metrology, Control systems

Showing 5 of 18 publications
Conference Committee Involvement (9)
Advances in X-Ray/EUV Optics and Components XIII
19 August 2018 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XII
8 August 2017 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XI
31 August 2016 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components X
11 August 2015 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components IX
19 August 2014 | San Diego, California, United States
Showing 5 of 9 published special sections
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