Raymond Frost
Engineer at Teledyne DALSA Semiconductor
SPIE Involvement:
Publications (7)

Proceedings Article | 23 July 2014 Paper
S. Holland, C. Bebek, F. Dion, R. Frost, R. Groulx, J. Lee, G. Wang
Proceedings Volume 9154, 91541E (2014) https://doi.org/10.1117/12.2057219
KEYWORDS: Charge-coupled devices, Transistors, Amplifiers, Optical amplifiers, Capacitance, Field effect transistors, Silica, CCD cameras, Diffusion, Electrodes

Proceedings Article | 25 September 2012 Paper
C. Bebek, R. Coles, P. Denes, F. Dion, J. Emes, R. Frost, D. Groom, R. Groulx, S. Haque, S. Holland, A. Karcher, W. Kolbe, J. Lee, N. Palaio, N. Roe, C. Tran, G. Wang
Proceedings Volume 8453, 845305 (2012) https://doi.org/10.1117/12.926606
KEYWORDS: Charge-coupled devices, Semiconducting wafers, Amplifiers, CCD cameras, Silicon, Quantum efficiency, Absorption, Silica, Plasma enhanced chemical vapor deposition, Cameras

Proceedings Article | 15 February 2012 Paper
S. Haque, F. Dion, R. Frost, R. Groulx, S. Holland, A. Karcher, W. Kolbe, N. Roe, G. Wang, Y. Yu
Proceedings Volume 8298, 82980X (2012) https://doi.org/10.1117/12.905460
KEYWORDS: Transistors, Amplifiers, Charge-coupled devices, Capacitance, Diffusion, Silicon, Field effect transistors, Interference (communication), Resistors, Electrodes

Proceedings Article | 19 January 2009 Paper
E. Bogaart, I. Peters, A. Kleimann, E.J. Manoury, W Klaassens, W.T.F.M. de Laat, C. Draijer, R. Frost, J. Bosiers
Proceedings Volume 7250, 725003 (2009) https://doi.org/10.1117/12.807540
KEYWORDS: Amplifiers, Semiconducting wafers, CCD image sensors, Imaging systems, Image sensors, Sensors, Electrons, Charge-coupled devices, Optical amplifiers, Microlens

Proceedings Article | 5 May 2008 Paper
Jan Bosiers, Holger Stoldt, Wilco Klaassens, Bart Dillen, Inge Peters, Erik Bogaart, Raymond Frost, Laurens Korthout, Jurgen Timpert
Proceedings Volume 6996, 69960Z (2008) https://doi.org/10.1117/12.785847
KEYWORDS: Imaging systems, Charge-coupled devices, Semiconducting wafers, Amplifiers, Sensors, CCD image sensors, Manufacturing, Electrons, Image sensors, Medical imaging

Showing 5 of 7 publications
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