Prof. Raymond F. Mercier
at Institut d'Astrophysique Spatiale
SPIE Involvement:
Conference Program Committee | Author
Publications (22)

PROCEEDINGS ARTICLE | July 6, 2018
Proc. SPIE. 10699, Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray
KEYWORDS: Telescopes, Mirrors, Cameras, Sensors, Calibration, Interferometry, Frequency modulation, Extreme ultraviolet, Fermium, Optical alignment

PROCEEDINGS ARTICLE | November 21, 2017
Proc. SPIE. 10569, International Conference on Space Optics — ICSO 2000
KEYWORDS: Diffraction, Telescopes, Polishing, Reflection, Interferometers, Sensors, Ions, Interferometry, Wavefronts, Distortion

PROCEEDINGS ARTICLE | September 21, 2015
Proc. SPIE. 9604, Solar Physics and Space Weather Instrumentation VI
KEYWORDS: Optical filters, Imaging systems, Sensors, Manufacturing, Frequency modulation, Extreme ultraviolet, Fermium, Space operations, Scanning tunneling microscopy, Instrument modeling

PROCEEDINGS ARTICLE | September 21, 2015
Proc. SPIE. 9604, Solar Physics and Space Weather Instrumentation VI
KEYWORDS: Staring arrays, Mirrors, Optical design, Imaging systems, Sensors, Interferometry, Extreme ultraviolet, Aluminum, Optical alignment, Bandpass filters

PROCEEDINGS ARTICLE | July 24, 2014
Proc. SPIE. 9144, Space Telescopes and Instrumentation 2014: Ultraviolet to Gamma Ray
KEYWORDS: Mathematical modeling, Optical filters, Mirrors, Imaging systems, Cameras, Sensors, Interfaces, Extreme ultraviolet, Space operations, Scanning tunneling microscopy

PROCEEDINGS ARTICLE | September 26, 2013
Proc. SPIE. 8862, Solar Physics and Space Weather Instrumentation V
KEYWORDS: Telescopes, Mirrors, Multilayers, Reflectivity, Space telescopes, Extreme ultraviolet, Aluminum, Synchrotrons, Deposition processes, Space operations

Showing 5 of 22 publications
Conference Committee Involvement (4)
Optical Fabrication, Testing, and Metrology IV
7 September 2011 | Marseille, France
Optical Fabrication, Testing, and Metrology III
2 September 2008 | Glasgow, Scotland, United Kingdom
Optical Fabrication, Testing, and Metrology II
13 September 2005 | Jena, Germany
Optical Fabrication, Testing, and Metrology
30 September 2003 | St. Etienne, France
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