Prof. Razvigor Ossikovski Profile

Prof. Razvigor Ossikovski

at Ecole Polytechnique

SPIE Involvement:

Author

Publications (14)

PROCEEDINGS ARTICLE | May 24, 2018

Mueller microscopy of anisotropic scattering media: theory and experiments

Proc. SPIE. 10677, Unconventional Optical Imaging

KEYWORDS: Microscopes, Polarization, Scattering media, Skin, Microscopy, Light scattering, Polarimetry, Collagen, Tissue optics

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PROCEEDINGS ARTICLE | May 24, 2018

Multimodal imaging Mueller polarimetric microscope to study polarimetric properties of spheroidal microparticles

Proc. SPIE. 10678, Optical Micro- and Nanometrology VII

KEYWORDS: Microscopes, Mueller matrices, Multimodal imaging, Polarization, Scattering, Calibration, Particles, Light scattering, Polarimetry, Objectives

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PROCEEDINGS ARTICLE | May 17, 2018

Indices of polarimetric purity to enhance the image quality in biophotonics applications

Proc. SPIE. 10685, Biophotonics: Photonic Solutions for Better Health Care VI

KEYWORDS: Linear polarizers, Statistical analysis, Polarization, Tissues, Matrices, Polarizers, Wave plates, Polarimetry, Image enhancement, Biological research

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PROCEEDINGS ARTICLE | April 5, 2018

Polarized light histology of tissue and differential Mueller matrix formalism (Conference Presentation)

Proc. SPIE. 10484, Advanced Biomedical and Clinical Diagnostic and Surgical Guidance Systems XVI

KEYWORDS: Mueller matrices, Cancer, Tissues, Scattering, Diagnostics, Polarimetry, Biopsy, Biological research, Tissue optics, Scatter measurement

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PROCEEDINGS ARTICLE | May 1, 2017

Optical biopsy of tissue with Mueller polarimetry: theory and experiments (Conference Presentation)

Proc. SPIE. 10060, Optical Biopsy XV: Toward Real-Time Spectroscopic Imaging and Diagnosis

KEYWORDS: Birefringence, Backscatter, Tissues, Scattering, Light scattering, Polarimetry, Biopsy, Colon, In vivo imaging, Tissue optics

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SPIE Journal Paper | June 22, 2016

Special Section Guest Editorial:Antonello De Martino (1954–2014): in memoriam

Novikova, Tatiana , Drévillon, Bernard , Schwartz, Laurent , Validire, Pierre , Nazac, André , Ossikovski, Razvigor , Garcia-Caurel, Enric , Laude-Boulesteix, Blandine , Anastasiadou, Makrina , Losurdo, Maria , Hinderl, Kurt , Ibrahim, Bicher Haj , Antonelli, Maria Rosaria , Pierangelo, Angelo , Deby, Stanislas , Roussel, Stéphane , Manhas, Sandeep , Vizet, Jérémy , Pagnoux, Dominique , Bancelin, Stéphane , Schanne-Klein, Marie-Claire , Rehbinder, Jean , Haddad, Huda , Moreau, François , Vanel, Jean-Charles , Roca i Cabarrocas, Pere , Tuchin, Valery , Jacques, Steven

JBO Vol. 21 Issue 07

KEYWORDS: Polarimetry, Biomedical optics, Physics, Infrared radiation, Cervical cancer, Head, Interfaces, Thin films, Scientific research, Quantum optics

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PROCEEDINGS ARTICLE | March 8, 2014

Strain engineering in germanium microdisks

Proc. SPIE. 8990, Silicon Photonics IX

KEYWORDS: Indium gallium arsenide, Luminescence, Germanium, Interfaces, Gallium arsenide, Silicon, Semiconductor lasers, Scanning electron microscopy, Wet etching, Silicon photonics

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SPIE Journal Paper | October 12, 2012

Comparative study of differential matrix and extended polar decomposition formalisms for polarimetric characterization of complex tissue-like turbid media

Kumar, Satish , Purwar, Harsh , Ossikovski, Razvigor , Vitkin, I. Alex , Ghosh, Nirmalya

JBO Vol. 17 Issue 10

KEYWORDS: Polarization, Polarimetry, Tissues, Wave plates, Mueller matrices, Tissue optics, Birefringence, Scattering, Matrices, Monte Carlo methods

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PROCEEDINGS ARTICLE | December 4, 2008

Characterization of inhomogeneous samples by spectroscopic Mueller polarimetry

Proc. SPIE. 7140, Lithography Asia 2008

KEYWORDS: Lithography, Mueller matrices, Metrology, Data modeling, Spectroscopy, Silicon, Polarimetry, Photoresist materials, Statistical modeling, Diffraction gratings

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PROCEEDINGS ARTICLE | April 12, 2007

Optics of nanogratings

Proc. SPIE. 6609, 15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Diffraction, Refractive index, Oscillators, Data modeling, Optical properties, Metals, Dielectrics, Electro optical modeling, Diffraction gratings, Absorption

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PROCEEDINGS ARTICLE | June 13, 2005

Influence of component imperfection on null ellipsometry with phase modulation

Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV

KEYWORDS: Ellipsometry, Statistical analysis, Phase modulation, Modulation, Birefringence, Calibration, Polarizers, Modulators, Precision measurement, Photoelastic modulators

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PROCEEDINGS ARTICLE | May 14, 2002

Analytic model for the erbium-ytterbium co-doped silicate fiber amplifier

Proc. SPIE. 4638, Optical Devices for Fiber Communication III

KEYWORDS: Fiber amplifiers, Optical amplifiers, Energy transfer, Ions, Amplifiers, Wave propagation, Ytterbium, Erbium, Silicates, Absorption

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PROCEEDINGS ARTICLE | April 24, 1995

Modulated photoellipsometry measurements of GaAs internal field

Proc. SPIE. 2397, Optoelectronic Integrated Circuit Materials, Physics, and Devices

KEYWORDS: Optical components, Ellipsometry, Modulation, Polarization, Dielectrics, Gallium arsenide, Phase shift keying, Laser beam diagnostics, Spectroscopes, Semiconductor characterization

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PROCEEDINGS ARTICLE | August 14, 1992

Infrared phase-modulated ellipsometer for in-situ characterization of surfaces and thin films

Proc. SPIE. 1681, Optically Based Methods for Process Analysis

KEYWORDS: Thin films, Mirrors, Digital signal processing, Modulation, Polarization, Sensors, Signal processing, Infrared radiation, Signal detection, Plasma

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Showing 5 of 14 publications

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