Rebecca Bell
President/CEO at GFM-3D Metrology USA Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 April 2008 Paper
Christian Benderoth, Rebecca Bell, Gottfried Frankowski
Proceedings Volume 6945, 69451M (2008) https://doi.org/10.1117/12.777500
KEYWORDS: 3D metrology, Facial recognition systems, Biometrics, 3D scanning, 3D acquisition, Micromirrors, Light sources, Glasses, Safety, Control systems

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