Dr. Rebecca J. Martinez
Production Manager at Wafer Technology Ltd
SPIE Involvement:
Author
Publications (19)

Proceedings Article | 14 May 2019
Proc. SPIE. 11002, Infrared Technology and Applications XLV
KEYWORDS: Oxides, Polishing, Cadmium, Sensors, Etching, Chemistry, Zinc, Compound semiconductors, Surface finishing, Chemical mechanical planarization

Proceedings Article | 7 May 2019
Proc. SPIE. 11002, Infrared Technology and Applications XLV
KEYWORDS: Long wavelength infrared, Mid-IR, Photodetectors, Quantum efficiency, Gallium antimonide, Diodes, Semiconducting wafers, Absorption

Proceedings Article | 7 May 2019
Proc. SPIE. 11002, Infrared Technology and Applications XLV
KEYWORDS: Sensors, Crystals, X-rays, Gallium antimonide, Infrared radiation, Antimony, Gallium, Tellurium

Proceedings Article | 16 May 2017
Proc. SPIE. 10177, Infrared Technology and Applications XLIII
KEYWORDS: Polishing, Statistical analysis, Crystals, Gallium arsenide, Indium, Gallium antimonide, Process control, Epitaxy, Semiconducting wafers, Yield improvement, Compound semiconductors

Proceedings Article | 16 May 2017
Proc. SPIE. 10177, Infrared Technology and Applications XLIII
KEYWORDS: Infrared detectors, Oxides, Polishing, Cadmium, Crystals, Manufacturing, Zinc, Epitaxy, Semiconducting wafers, Infrared materials, Tellurium, Compound semiconductors, Surface finishing

Proceedings Article | 20 May 2016
Proc. SPIE. 9819, Infrared Technology and Applications XLII
KEYWORDS: Oxides, Polishing, Etching, Air contamination, Crystals, Chemistry, Gallium antimonide, Semiconducting wafers, Surface finishing, Chemical mechanical planarization

Showing 5 of 19 publications
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