Dr. Regita Bendikiene
at Kaunas University of Technology
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | April 2, 2010
Proc. SPIE. 7638, Metrology, Inspection, and Process Control for Microlithography XXIV
KEYWORDS: Diffraction, Mirrors, Polymers, Error analysis, Silicon, Optical testing, Process control, Geometrical optics, Helium cadmium lasers, Diffraction gratings

PROCEEDINGS ARTICLE | April 3, 2009
Proc. SPIE. 7286, Modeling, Signal Processing, and Control for Smart Structures 2009
KEYWORDS: Photoelasticity, Digital image processing, Digital photography, Polarization, Visualization, Solids, Finite element methods, Smart structures, Chemical elements, Stress analysis

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