Dr. Reinhard Voelkel
CEO at SUSS MicroOptics SA
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
micro-optics , fiber , illumination , wafer-level optics , optical interconnects , lithography
Websites:
Profile Summary

More than 30 years experience in Optics, Micro-Optics, Optical Communication, Imaging Systems, Microtechnology, MEMS, Bio-MEMS, Sensors and Semiconductor Manufacturing Technology.

General Management, Technology Management, Research & Development, Strategic Planning, Business Development, Project and Program Management, Relationship Development, Intellectual Property, Quality Assurance, Problem Resolution, Communications, Technical Publications and Presentations.
Specialties

Technical: Photonics, Nanotechnology, Engineering, Micro-Optical Elements, Microlens Arrays, Optical Design, Optical Interconnections, Fiber Optics, Telecom, Datacom, Silicon Photonics, Optical Bio-Chips, Chemical Micro-Chips, Optical Sensors, Metrology, MEMS, MOEMS, Bio-MEMS, Microfluidic, Laser, Med-Tech, Data Sciences, Big Data, Miniaturized Cameras, Ultra-Flat Cameras, Wafer-Level Cameras, Wafer-Level Packaging, Wafer-Based Micro-Fabrication.
Publications (75)

Proceedings Article | 30 August 2019
Proc. SPIE. 11103, Optical Modeling and System Alignment
KEYWORDS: Wafer-level optics, Microlens array, Manufacturing, Microlens, Reactive ion etching, Semiconducting wafers, Tolerancing, Optics manufacturing, Picture Archiving and Communication System

Proceedings Article | 30 August 2019
Proc. SPIE. 11103, Optical Modeling and System Alignment
KEYWORDS: Optical design, Imaging systems, Wavefront aberrations, Zernike polynomials, Ray tracing, Microlens, Geometrical optics, Tolerancing, Optics manufacturing

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Confocal microscopy, Microscopes, Wavefront aberrations, Micro optics, Microlens, Neural networks, Machine learning

Proceedings Article | 26 March 2019
Proc. SPIE. 10958, Novel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019
KEYWORDS: Reflectors, Lithography, Light emitting diodes, Lithographic illumination, Spatial coherence

Proceedings Article | 15 June 2018
Proc. SPIE. 10692, Optical Fabrication, Testing, and Metrology VI
KEYWORDS: Metrology, Optical spheres, Calibration, Profilometers, Micro optics, Microlens, Aspheric lenses, Spherical lenses

Showing 5 of 75 publications
Conference Committee Involvement (20)
Optical Fabrication, Testing, and Metrology VII
13 September 2021 | Madrid, Spain
Optical Lithography XXXIV
21 February 2021 | San Jose, California, United States
Digital Optics for Immersive Displays II (DOID20)
7 April 2020 | Online Only, France
3D Printed Optics and Additive Photonic Manufacturing II
7 April 2020 | Online Only, France
Optical Microlithography XXXIII
25 February 2020 | San Jose, California, United States
Showing 5 of 20 Conference Committees
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