Dr. Renfei Feng
at Canadian Light Source Inc
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 3, 2008
Proc. SPIE. 7077, Advances in X-Ray/EUV Optics and Components III
KEYWORDS: Diffraction, Multilayers, Light sources, Crystals, X-rays, Reflectivity, Atomic force microscopy, Laser crystals, Monochromators, Molybdenum

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