Dr. Reto Häring
at Instrument Systems Optische Messtechnik GmbH
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | May 23, 2011
Proc. SPIE. 8083, Modeling Aspects in Optical Metrology III
KEYWORDS: Diffraction, Light emitting diodes, Scattering, Spectroscopy, Light scattering, Computer simulations, Monte Carlo methods, Ray tracing, Stray light, Diffraction gratings

PROCEEDINGS ARTICLE | February 25, 2008
Proc. SPIE. 6876, High-Power Diode Laser Technology and Applications VI
KEYWORDS: Mirrors, Second-harmonic generation, Optical amplifiers, Ultraviolet radiation, Crystals, Semiconductor lasers, Gas lasers, Diodes, Nonlinear crystals, Laser systems engineering

PROCEEDINGS ARTICLE | February 27, 2007
Proc. SPIE. 6485, Novel In-Plane Semiconductor Lasers VI
KEYWORDS: Diffraction, Waveguides, Spectroscopy, Manufacturing, Amplifiers, Laser beam propagation, Semiconductor lasers, Near field, Measurement devices, Gallium

PROCEEDINGS ARTICLE | February 8, 2007
Proc. SPIE. 6485, Novel In-Plane Semiconductor Lasers VI
KEYWORDS: Diffraction, Tunable lasers, Lithium, Optical amplifiers, Oscillators, Spectroscopy, Semiconductor lasers, Diodes, Laser spectroscopy, Laser systems engineering

PROCEEDINGS ARTICLE | April 27, 2005
Proc. SPIE. 5707, Solid State Lasers XIV: Technology and Devices
KEYWORDS: Second-harmonic generation, Optical amplifiers, Oscillators, Microscopy, Semiconductor lasers, Solids, Diodes, Picosecond phenomena, Pulsed laser operation, Laser systems engineering

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