Dr. Ricardo Legarda-Sáenz
Researcher at Univ Autonoma de Yucatan
Area of Expertise:
Scientific computing , Camera calibration , Fringe processing , Parallel computing
Profile Summary

My principal research interest is the applications of optical shape measurement for the evaluation of complex objects. At present, I am working in the calibration and measurement of a fringe projection system, and the measured data matching from different views and/or different devices. Secondary interests are the processing of fringe patterns using inverse-problems approach, and applications with moire deflectometry. In these topics, papers were published in peer-review journals.
Publications (13)

SPIE Journal Paper | 28 April 2018
OE Vol. 57 Issue 04
KEYWORDS: Synthetic aperture radar, Image processing, MATLAB, Optical engineering, Image analysis, Magnetic resonance imaging, Interferometric synthetic aperture radar, Algorithm development, Field programmable gate arrays, Computer programming

Proceedings Article | 6 September 2017
Proc. SPIE. 10410, Unconventional and Indirect Imaging, Image Reconstruction, and Wavefront Sensing 2017
KEYWORDS: Light sources, 3D image reconstruction, Cameras, Reflectivity, Linear filtering, 3D modeling, Machine vision, Reconstruction algorithms, 3D vision, 3D image processing

Proceedings Article | 12 September 2014
Proc. SPIE. 9219, Infrared Remote Sensing and Instrumentation XXII
KEYWORDS: Modulation, Digital filtering, Phase shift keying, Linear filtering, Gaussian filters, 3D metrology, Projection systems, Picosecond phenomena, Binary data, Phase shifts

Proceedings Article | 19 September 2013
Proc. SPIE. 8867, Infrared Remote Sensing and Instrumentation XXI
KEYWORDS: Optical components, Prisms, Modulation, Interferometers, Wavefronts, Control systems, Phase measurement, Wavefront reconstruction, Electroluminescent displays, Shearing interferometers

Proceedings Article | 19 September 2013
Proc. SPIE. 8867, Infrared Remote Sensing and Instrumentation XXI
KEYWORDS: Refractive index, Fringe analysis, Cameras, Image processing, Wavefronts, Distortion, CCD cameras, LCDs, Phase measurement, Phase shifts

Showing 5 of 13 publications
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