Prof. Richard A. Abram
Emeritus Professor of Physics at Durham Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (6)

PROCEEDINGS ARTICLE | February 1, 2007
Proc. SPIE. 6472, Terahertz and Gigahertz Electronics and Photonics VI
KEYWORDS: Fabrication, Gold, Plasmonics, Optical filters, Metals, Spectroscopy, Ultraviolet radiation, Free space, Terahertz radiation, Micromachining

PROCEEDINGS ARTICLE | September 8, 2006
Proc. SPIE. 6328, Nanomodeling II
KEYWORDS: Gold, Plasmons, Finite-difference time-domain method, Polarization, Electromagnetic radiation, Terahertz radiation, Radio propagation, Dielectric polarization, Plasma, Absorption

PROCEEDINGS ARTICLE | August 30, 2006
Proc. SPIE. 6323, Plasmonics: Metallic Nanostructures and their Optical Properties IV
KEYWORDS: Optical filters, Signal attenuation, Spectroscopy, Copper, Silicon, Biosensors, Terahertz radiation, Microwave radiation, Semiconducting wafers, Information operations

PROCEEDINGS ARTICLE | March 7, 2006
Proc. SPIE. 6120, Terahertz and Gigahertz Electronics and Photonics V
KEYWORDS: Refractive index, Optical spheres, Data modeling, Scattering, Signal attenuation, Wave propagation, Terahertz radiation, Mie scattering, Spherical lenses, Electromagnetic scattering

PROCEEDINGS ARTICLE | November 4, 2005
Proc. SPIE. 5989, Technologies for Optical Countermeasures II; Femtosecond Phenomena II; and Passive Millimetre-Wave and Terahertz Imaging II
KEYWORDS: Mathematical modeling, Refractive index, Optical spheres, Data modeling, Scattering, Signal attenuation, Dielectrics, Terahertz radiation, Mie scattering, Absorbance

PROCEEDINGS ARTICLE | March 1, 1991
Proc. SPIE. 1361, Physical Concepts of Materials for Novel Optoelectronic Device Applications I: Materials Growth and Characterization
KEYWORDS: Optical components, Quantum wells, Optical properties, Indium, Transition metals, Optoelectronic devices, Laser damage threshold, Optical matrix switches, Instrument modeling, Absorption

Showing 5 of 6 publications
Conference Committee Involvement (1)
Nanomodeling II
13 August 2006 | San Diego, California, United States
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