Dr. Richard J. Blackwell
Senior Principal Systems Engineer at BAE Systems
SPIE Involvement:
Conference Program Committee | Author
Publications (16)

Proceedings Article | 8 June 2015 Paper
Louise Sengupta, Pierre-Alain Auroux, Don McManus, D. Ahmasi Harris, Richard Blackwell, Jeffrey Bryant, Mihir Boal, Evan Binkerd
Proceedings Volume 9451, 94511B (2015) https://doi.org/10.1117/12.2177011
KEYWORDS: Cameras, Staring arrays, Packaging, Thermography, Long wavelength infrared, Semiconducting wafers, Wafer-level optics, Silicon, Readout integrated circuits, Imaging systems

Proceedings Article | 11 June 2013 Paper
Proceedings Volume 8704, 87041J (2013) https://doi.org/10.1117/12.2018090
KEYWORDS: Imaging systems, Thermography, Cameras, Electronics, Sensors, Night vision systems, Long wavelength infrared, Telecommunications, Infrared sensors, Defense technologies

Proceedings Article | 4 May 2010 Paper
Richard Blackwell, Glen Franks, Daniel Lacroix, Sandra Hyland, Robert Murphy
Proceedings Volume 7660, 76600Y (2010) https://doi.org/10.1117/12.852970
KEYWORDS: Microbolometers, Staring arrays, Imaging systems, Sensors, Situational awareness sensors, Manufacturing, Thermography, Optics manufacturing, Semiconducting wafers, Weapons

Proceedings Article | 7 May 2009 Paper
Richard Blackwell, Daniel Lacroix, Tuyet Bach, Jonathan Ishii, Sandra Hyland, Thomas Dumas, Scott Carpenter, Sherman Chan, Balwinder Sujlana
Proceedings Volume 7298, 72980P (2009) https://doi.org/10.1117/12.819389
KEYWORDS: Staring arrays, Microbolometers, Long wavelength infrared, Bolometers, Fluctuations and noise, Infrared radiation, Data modeling, Standards development, Systems modeling, Visual process modeling

Proceedings Article | 15 May 2008 Paper
Richard Blackwell, Daniel Lacroix, Tuyet Bach, Jonathan Ishii, Sandra Hyland, Jeannie Geneczko, Sherman Chan, Balwinder Sujlana, Mike Joswick
Proceedings Volume 6940, 694021 (2008) https://doi.org/10.1117/12.783931
KEYWORDS: Readout integrated circuits, Staring arrays, Semiconducting wafers, Imaging systems, Microbolometers, Long wavelength infrared, Standards development, Thermography, Infrared radiation, Cameras

Showing 5 of 16 publications
Conference Committee Involvement (2)
Infrared Technology and Applications LI
13 April 2025 | Orlando, Florida, United States
Infrared Technology and Applications L
21 April 2024 | National Harbor, Maryland, United States
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