Dr. Richard J. Blackwell
Senior Principal Systems Engineer at BAE Systems
SPIE Involvement:
Author
Publications (16)

PROCEEDINGS ARTICLE | June 8, 2015
Proc. SPIE. 9451, Infrared Technology and Applications XLI
KEYWORDS: Staring arrays, Packaging, Readout integrated circuits, Wafer-level optics, Long wavelength infrared, Thermography, Imaging systems, Cameras, Silicon, Semiconducting wafers

PROCEEDINGS ARTICLE | June 11, 2013
Proc. SPIE. 8704, Infrared Technology and Applications XXXIX
KEYWORDS: Long wavelength infrared, Thermography, Infrared sensors, Electronics, Imaging systems, Cameras, Sensors, Telecommunications, Defense technologies, Night vision systems

PROCEEDINGS ARTICLE | May 4, 2010
Proc. SPIE. 7660, Infrared Technology and Applications XXXVI
KEYWORDS: Staring arrays, Microbolometers, Thermography, Weapons, Imaging systems, Sensors, Manufacturing, Semiconducting wafers, Optics manufacturing, Situational awareness sensors

PROCEEDINGS ARTICLE | May 7, 2009
Proc. SPIE. 7298, Infrared Technology and Applications XXXV
KEYWORDS: Staring arrays, Bolometers, Microbolometers, Long wavelength infrared, Visual process modeling, Fluctuations and noise, Data modeling, Infrared radiation, Systems modeling, Standards development

PROCEEDINGS ARTICLE | May 15, 2008
Proc. SPIE. 6940, Infrared Technology and Applications XXXIV
KEYWORDS: Staring arrays, Readout integrated circuits, Microbolometers, Long wavelength infrared, Thermography, Imaging systems, Cameras, Infrared radiation, Semiconducting wafers, Standards development

PROCEEDINGS ARTICLE | May 14, 2007
Proc. SPIE. 6542, Infrared Technology and Applications XXXIII
KEYWORDS: Staring arrays, Readout integrated circuits, Microbolometers, Semiconductors, Thermography, Electronics, Patents, Imaging systems, CMOS technology, Standards development

Showing 5 of 16 publications
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