Dr. Richard E. Colbeth
SVP Engineering, Detectors at Varex Imaging Corp
SPIE Involvement:
Publications (23)

Proceedings Article | 16 March 2020 Paper
Proceedings Volume 11312, 113123W (2020) https://doi.org/10.1117/12.2549469
KEYWORDS: Sensors, Amorphous silicon, Imaging systems, Field emission displays, Modulation transfer functions, Spatial frequencies, CMOS sensors, Signal to noise ratio, Sensor performance, X-rays

Proceedings Article | 16 March 2020 Presentation + Paper
Proceedings Volume 11312, 1131220 (2020) https://doi.org/10.1117/12.2549781
KEYWORDS: Dual energy imaging, X-rays, Imaging systems, Prototyping, Bone

Proceedings Article | 16 March 2020 Paper
Proceedings Volume 11312, 113123Q (2020) https://doi.org/10.1117/12.2549549
KEYWORDS: Systems modeling, Iodine, Scintillators, Imaging systems, X-rays, Computed tomography, Dual energy imaging

Proceedings Article | 3 April 2019 Presentation + Paper
Proceedings Volume 10948, 109480F (2019) https://doi.org/10.1117/12.2513500
KEYWORDS: Amorphous silicon, Sensors, CMOS sensors, Scintillators, X-rays, Modulation transfer functions, Imaging systems, X-ray imaging

Proceedings Article | 9 March 2018 Presentation + Paper
Arundhuti Ganguly, P. Gerhard Roos, Tom Simak, J. Michael Yu, Steven Freestone, Donald Hondongwa, Richard Colbeth, Ivan Mollov
Proceedings Volume 10573, 105730N (2018) https://doi.org/10.1117/12.2293771
KEYWORDS: Sensors, X-rays, CMOS sensors, Imaging systems, X-ray imaging, X-ray detectors, Modulation transfer functions, Scintillators, Image resolution, Semiconducting wafers

Showing 5 of 23 publications
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