Dr. Richard L. Espinola
Electronics Engineer at US Naval Research Lab
SPIE Involvement:
Conference Program Committee | Journal Editorial Board Member | Author
Publications (27)

SPIE Journal Paper | 27 February 2018
OE Vol. 57 Issue 02
KEYWORDS: Image compression, Image quality, Sensor performance, Image sensors, Electro optical modeling, Performance modeling, Sensors, Modulation transfer functions, Image processing, Point spread functions

Proceedings Article | 7 May 2017
Proc. SPIE. 10204, Long-Range Imaging II
KEYWORDS: Modulation, Imaging systems, Spatial frequencies, Sensors, Image processing, Image resolution, Image quality, Image sensors, Data processing, Turbulence, Range imaging, Optical resolution, Scintillation, Modulation transfer functions, Atmospheric turbulence, Atmospheric optics

Proceedings Article | 13 May 2016
Proc. SPIE. 9863, Smart Biomedical and Physiological Sensor Technology XIII
KEYWORDS: Target detection, Long wavelength infrared, Visible radiation, Eye, Roads, Surgery, Cameras, Sensors, Video, Target recognition

Proceedings Article | 12 May 2015
Proc. SPIE. 9452, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI
KEYWORDS: Biometrics, Facial recognition systems, Detection and tracking algorithms, Imaging systems, Cameras, Sensors, Databases, Distortion, Turbulence, Atmospheric turbulence

Proceedings Article | 9 June 2014
Proc. SPIE. 9071, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV
KEYWORDS: Spatial frequencies, Sensors, Image resolution, Distortion, Computer simulations, Turbulence, Modulation transfer functions, Scene simulation, Atmospheric turbulence, Atmospheric modeling

Showing 5 of 27 publications
Conference Committee Involvement (11)
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXI
26 April 2020 | Anaheim, California, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
16 April 2019 | Baltimore, Maryland, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX
17 April 2018 | Orlando, Florida, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII
11 April 2017 | Anaheim, California, United States
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
19 April 2016 | Baltimore, Maryland, United States
Showing 5 of 11 Conference Committees
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