Prof. Richard K. Leach Profile

Prof. Richard K. Leach

Professor at Univ of Nottingham

SPIE Involvement:

Conference Program Committee | Author

Publications (12)

SPIE Journal Paper | October 11, 2017

Flexible decoupled camera and projector fringe projection system using inertial sensors

Stavroulakis, Petros , Sims-Waterhouse, Danny , Piano, Samanta , Leach, Richard

OE Vol. 56 Issue 10

KEYWORDS: Cameras, Projection systems, Sensors, Clouds, Calibration, Imaging systems, Data acquisition, Computer aided design, Manufacturing, Optical engineering

Read Abstract

DOWNLOAD PDF

PROCEEDINGS ARTICLE | August 23, 2017

Fusion of light-field and photogrammetric surface form data

Proc. SPIE. 10373, Applied Optical Metrology II

KEYWORDS: Image fusion, Imaging systems, Cameras, Photography, Clouds, 3D modeling, Photogrammetry, Optical metrology, 3D metrology, Data fusion

Read Abstract

SPIE Journal Paper | July 25, 2017

Optimization of surface measurement for metal additive manufacturing using coherence scanning interferometry

Gomez, Carlos , Su, Rong , Thompson, Adam , DiSciacca, Jack , Lawes, Simon , Leach, Richard

OE Vol. 56 Issue 11

Read Abstract

DOWNLOAD PDF

PROCEEDINGS ARTICLE | June 26, 2017

Experimental comparison of photogrammetry for additive manufactured parts with and without laser speckle projection

Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X

KEYWORDS: Speckle, Cameras, Polymers, Metals, Manufacturing, Clouds, Photogrammetry, Additive manufacturing, 3D metrology, Light sources and illumination, Computer aided design

Read Abstract

PROCEEDINGS ARTICLE | June 26, 2017

Tolerance on sphere radius for the calibration of the transfer function of coherence scanning interferometry

Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X

KEYWORDS: Point spread functions, Metrology, Interferometers, Calibration, Interferometry, 3D modeling, Analytical research, Spherical lenses, Tolerancing

Read Abstract

PROCEEDINGS ARTICLE | June 26, 2017

Combined use of a priori data for fast system self-calibration of a non-rigid multi-camera fringe projection system

Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI

KEYWORDS: Modeling, Visualization, Cameras, Calibration, 3D modeling, 3D metrology, Projection systems, Motion measurement

Read Abstract

PROCEEDINGS ARTICLE | May 8, 2012

Application of linear systems theory to characterize coherence scanning interferometry

Proc. SPIE. 8430, Optical Micro- and Nanometrology IV

KEYWORDS: Point spread functions, Refractive index, Optical spheres, Calibration, Mercury, Interferometry, Linear filtering, Image filtering, Electronic filtering, Spherical lenses

Read Abstract

PROCEEDINGS ARTICLE | May 5, 2012

Determination of the metrological characteristics of optical surface topography measuring instruments

Proc. SPIE. 8430, Optical Micro- and Nanometrology IV

KEYWORDS: Confocal microscopy, Optical components, Microscopes, Metrology, Interferometers, Calibration, Objectives, Optical calibration, Nanolithography, Standards development

Read Abstract

PROCEEDINGS ARTICLE | May 5, 2012

Advances in calibration methods for micro- and nanoscale surfaces

Proc. SPIE. 8430, Optical Micro- and Nanometrology IV

KEYWORDS: Confocal microscopy, Optical components, Metrology, Optical spheres, Scattering, Calibration, Manufacturing, Optics manufacturing, Nanolithography, Standards development

Read Abstract

PROCEEDINGS ARTICLE | January 12, 2009

Dimensional nanometrology at the National Physical Laboratory

Proc. SPIE. 7133, Fifth International Symposium on Instrumentation Science and Technology

Read Abstract

PROCEEDINGS ARTICLE | February 5, 2002

Traceable measurement of surface texture in the optics industry

Proc. SPIE. 4411, Large Lenses and Prisms

Read Abstract

PROCEEDINGS ARTICLE | September 30, 1998

Measurement of a correction for the phase change on reflection due to surface roughness

Proc. SPIE. 3477, Recent Developments in Optical Gauge Block Metrology

KEYWORDS: Optical spheres, Diffuse reflectance spectroscopy, Reflection, Sensors, Calibration, Reflectivity, Surface roughness, Integrating spheres, Surface finishing, Nanolithography

Read Abstract

Showing 5 of 12 publications

Conference Committee Involvement (1)

Applied Optical Metrology II

8 August 2017 | San Diego, California, United States

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years