Prof. Richard K. Leach Profile

Prof. Richard K. Leach

Professor at Univ of Nottingham

SPIE Involvement:

Conference Program Committee | Author

Publications (11)

PROCEEDINGS ARTICLE | August 23, 2017

Fusion of light-field and photogrammetric surface form data

Proc. SPIE. 10373, Applied Optical Metrology II

KEYWORDS: Data fusion, Cameras, Clouds, Photogrammetry, Image fusion, Optical metrology, 3D modeling, Imaging systems, 3D metrology, Photography

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SPIE Journal Paper | July 25, 2017

Optimization of surface measurement for metal additive manufacturing using coherence scanning interferometry

Gomez, Carlos , Su, Rong , Thompson, Adam , DiSciacca, Jack , Lawes, Simon , Leach, Richard

OE Vol. 56 Issue 11

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PROCEEDINGS ARTICLE | June 26, 2017

Experimental comparison of photogrammetry for additive manufactured parts with and without laser speckle projection

Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X

KEYWORDS: Photogrammetry, Speckle, Additive manufacturing, 3D metrology, Clouds, Polymers, Metals, Computer aided design, Cameras, Light sources and illumination, Manufacturing

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PROCEEDINGS ARTICLE | June 26, 2017

Combined use of a priori data for fast system self-calibration of a non-rigid multi-camera fringe projection system

Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI

KEYWORDS: Motion measurement, Visualization, Calibration, Projection systems, Cameras, 3D metrology, 3D modeling, Modeling

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PROCEEDINGS ARTICLE | June 26, 2017

Tolerance on sphere radius for the calibration of the transfer function of coherence scanning interferometry

Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X

KEYWORDS: Analytical research, Spherical lenses, Calibration, Tolerancing, Interferometry, Metrology, Point spread functions, 3D modeling, Interferometers

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PROCEEDINGS ARTICLE | May 8, 2012

Application of linear systems theory to characterize coherence scanning interferometry

Proc. SPIE. 8430, Optical Micro- and Nanometrology IV

KEYWORDS: Point spread functions, Optical spheres, Electronic filtering, Calibration, Mercury, Spherical lenses, Interferometry, Linear filtering, Image filtering, Refractive index

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PROCEEDINGS ARTICLE | May 5, 2012

Determination of the metrological characteristics of optical surface topography measuring instruments

Proc. SPIE. 8430, Optical Micro- and Nanometrology IV

KEYWORDS: Calibration, Metrology, Standards development, Nanolithography, Interferometers, Microscopes, Optical calibration, Confocal microscopy, Optical components, Objectives

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PROCEEDINGS ARTICLE | May 5, 2012

Advances in calibration methods for micro- and nanoscale surfaces

Proc. SPIE. 8430, Optical Micro- and Nanometrology IV

KEYWORDS: Calibration, Optical components, Standards development, Optics manufacturing, Nanolithography, Metrology, Scattering, Confocal microscopy, Optical spheres, Manufacturing

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PROCEEDINGS ARTICLE | January 12, 2009

Dimensional nanometrology at the National Physical Laboratory

Proc. SPIE. 7133, Fifth International Symposium on Instrumentation Science and Technology

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PROCEEDINGS ARTICLE | February 5, 2002

Traceable measurement of surface texture in the optics industry

Proc. SPIE. 4411, Large Lenses and Prisms

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PROCEEDINGS ARTICLE | September 30, 1998

Measurement of a correction for the phase change on reflection due to surface roughness

Proc. SPIE. 3477, Recent Developments in Optical Gauge Block Metrology

KEYWORDS: Reflection, Calibration, Sensors, Optical spheres, Surface roughness, Nanolithography, Integrating spheres, Reflectivity, Diffuse reflectance spectroscopy, Surface finishing

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Showing 5 of 11 publications

Conference Committee Involvement (1)

Applied Optical Metrology II

8 August 2017 | San Diego, California, United States

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