Prof. Richard K. Leach
Professor at Univ of Nottingham
SPIE Involvement:
Conference Program Committee | Author
Publications (11)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Data fusion, Cameras, Clouds, Photogrammetry, Image fusion, Optical metrology, 3D modeling, Imaging systems, 3D metrology, Photography

SPIE Journal Paper | July 25, 2017
OE Vol. 56 Issue 11

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Photogrammetry, Speckle, Additive manufacturing, 3D metrology, Clouds, Polymers, Metals, Computer aided design, Cameras, Light sources and illumination, Manufacturing

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Motion measurement, Visualization, Calibration, Projection systems, Cameras, 3D metrology, 3D modeling, Modeling

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Analytical research, Spherical lenses, Calibration, Tolerancing, Interferometry, Metrology, Point spread functions, 3D modeling, Interferometers

PROCEEDINGS ARTICLE | May 8, 2012
Proc. SPIE. 8430, Optical Micro- and Nanometrology IV
KEYWORDS: Point spread functions, Optical spheres, Electronic filtering, Calibration, Mercury, Spherical lenses, Interferometry, Linear filtering, Image filtering, Refractive index

Showing 5 of 11 publications
Conference Committee Involvement (1)
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
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