Prof. Richard K. Leach
Professor at Univ of Nottingham
SPIE Involvement:
Conference Program Committee | Editor | Author
Publications (20)

Proceedings Article | 7 April 2020 Presentation + Paper
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Scattering, Light scattering, Computer simulations, Neural networks, Machine learning

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Signal to noise ratio, Modeling, Spatial frequencies, Scattering, Interferometers, 3D metrology, Surface quality testing, Diffraction gratings

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Metrology, Cameras, Photography, Computer simulations, Clouds, Data acquisition, Photogrammetry, Additive manufacturing, 3D metrology, Computer aided design

SPIE Journal Paper | 25 March 2020
OE Vol. 59 Issue 03
KEYWORDS: 3D modeling, Instrument modeling, Microscopy, Scattering, Optical engineering, Spatial frequencies, Objectives, Multiple scattering, Data modeling, Polarization

Proceedings Article | 3 September 2019 Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Diffraction, Point spread functions, Imaging systems, Spatial frequencies, Interferometers, Reflectivity, Interferometry, 3D modeling, 3D metrology, Modulation transfer functions

Showing 5 of 20 publications
Proceedings Volume Editor (1)

SPIE Conference Volume | 16 April 2020

Conference Committee Involvement (7)
Optical Instrument Science, Technology, and Applications
13 September 2021 | Madrid, Spain
Applied Optical Metrology III
1 August 2021 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Online Only, Germany
Optics and Photonics for Advanced Dimensional Metrology
6 April 2020 | Online Only, France
Applied Optical Metrology III
13 August 2019 | San Diego, California, United States
Showing 5 of 7 Conference Committees
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