Prof. Richard K. Leach
Professor at Univ of Nottingham
SPIE Involvement:
Conference Chair | Conference Program Committee | Author
Publications (16)

Proceedings Article | 3 September 2019
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Diffraction, Point spread functions, Imaging systems, Spatial frequencies, Interferometers, Reflectivity, Interferometry, 3D modeling, 3D metrology, Modulation transfer functions

Proceedings Article | 3 September 2019
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Spatial frequencies, Microscopy, Manufacturing, 3D modeling, 3D metrology

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Modeling, Spatial frequencies, Scattering, Interferometry, 3D modeling, Multiple scattering, Phase measurement, Systems modeling, Instrument modeling

Proceedings Article | 7 March 2019
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Electronics, Defect detection, Spatial filters, Sensors, Manufacturing, Inspection, Photodiodes, Printing, Optics manufacturing, Defect inspection

SPIE Journal Paper | 11 October 2017
OE Vol. 56 Issue 10
KEYWORDS: Cameras, Projection systems, Sensors, Clouds, Calibration, Imaging systems, Data acquisition, Computer aided design, Manufacturing, Optical engineering

Showing 5 of 16 publications
Conference Committee Involvement (4)
Optics and Photonics for Advanced Dimensional Metrology
31 March 2020 | Strasbourg, France
Applied Optical Metrology III
13 August 2019 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
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