Dr. Richard A. Plass
Sr. Member of Technical Staff at Sandia National Labs
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 23 December 2003 Paper
Richard Plass, Michael Baker, Jeremy Walraven
Proceedings Volume 5343, (2003) https://doi.org/10.1117/12.530936
KEYWORDS: Actuators, Thermal modeling, Reliability, Scanning electron microscopy, Silicon, Resistance, Photomicroscopy, Microelectromechanical systems, Modulation, Data modeling

Proceedings Article | 23 December 2003 Paper
Steven Thornberg, Kevin Zavadil, James Ohlhausen, Michael Keenan, Diane Peebles, Gerald Knorovsky, Danny MacCallum, Brooke Nowak-Neely, Ion Abraham, Richard Plass
Proceedings Volume 5343, (2003) https://doi.org/10.1117/12.524777
KEYWORDS: Chemical analysis, Silicon, Microelectromechanical systems, Ions, Microsystems, Pulmonary function tests, Gases, Aluminum, Reliability, Sodium

Proceedings Article | 16 January 2003 Paper
Matthew Hankins, Paul Resnick, Peggy Clews, Thomas Mayer, David Wheeler, Danelle Tanner, Richard Plass
Proceedings Volume 4980, (2003) https://doi.org/10.1117/12.478206
KEYWORDS: Coating, Microelectromechanical systems, Silicon, Humidity, Nitrogen, Self-assembled monolayers, Liquids, Semiconducting wafers, Molecules, Oxides

Proceedings Article | 16 January 2003 Paper
Proceedings Volume 4980, (2003) https://doi.org/10.1117/12.476366
KEYWORDS: Electrodes, Silicon, Interfaces, Oxides, Microelectromechanical systems, Humidity, Scanning electron microscopy, Photomicroscopy, Oxygen, Oxidation

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