Dr. Richard M. Wasserman
AMS Research Manager at Micro Encoder Inc
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 22 May 2003
Proc. SPIE. 5011, Machine Vision Applications in Industrial Inspection XI
KEYWORDS: Signal to noise ratio, Imaging systems, Cameras, Image resolution, Digital cameras, Image quality, Quantization, Light sources and illumination, Spatial resolution, Analog electronics

Proceedings Article | 22 May 2003
Proc. SPIE. 5011, Machine Vision Applications in Industrial Inspection XI
KEYWORDS: Signal to noise ratio, Point spread functions, Edge detection, Visual process modeling, Detection and tracking algorithms, Data modeling, Image processing, Image resolution, Computer simulations, Reconstruction algorithms

Proceedings Article | 25 October 2002
Proc. SPIE. 4772, Electro-Optical System Design, Simulation, Testing, and Training
KEYWORDS: Edge detection, Metrology, Visualization, Cameras, Inspection, Quality measurement, Optical inspection, Light sources and illumination, Machine vision, Computer aided design

Proceedings Article | 7 May 1997
Proc. SPIE. 3031, Medical Imaging 1997: Image Display
KEYWORDS: Digital signal processing, Imaging systems, Cameras, Image processing, Distortion, Digital imaging, Mammography, Charge-coupled devices, CCD image sensors, Digital mammography

Proceedings Article | 16 April 1996
Proc. SPIE. 2710, Medical Imaging 1996: Image Processing
KEYWORDS: Information fusion, Data modeling, Magnetic resonance imaging, Image segmentation, Heart, 3D modeling, Medical imaging, Tomography, Positron emission tomography, Fuzzy logic

Showing 5 of 10 publications
Proceedings Volume Editor (1)

SPIE Conference Volume | 25 October 2002

Conference Committee Involvement (2)
Electro-Optical System Design, Simulation, Testing, and Training
10 July 2002 | Seattle, WA, United States
Machine Vision
1 November 1999 | Bellevue, WA, United States
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