Prof. Rihong Zhu
Professor at Nanjing Univ of Science and Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (51)

PROCEEDINGS ARTICLE | November 5, 2018
Proc. SPIE. 10811, High-Power Lasers and Applications IX
KEYWORDS: Fiber amplifiers, Optical amplifiers, Oscillators, Phase modulation, Polarization, Laser applications, Laser scattering, Amplifiers, Fiber lasers, High power fiber amplifiers

SPIE Journal Paper | February 16, 2018
OE Vol. 57 Issue 02
KEYWORDS: Glasses, Monochromatic aberrations, High power lasers, Laser systems engineering, Refractive index, Phase shifts, Optical engineering, Optical simulations, Photovoltaics, Fiber lasers

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10619, 2017 International Conference on Optical Instruments and Technology: Advanced Laser Technology and Applications
KEYWORDS: Optical components, High power lasers, Numerical simulations, Near field, Thermal effects, Laser systems engineering

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Mirrors, Phase shifting, Modulation, Interferometers, Error analysis, Interferometry, Phase shift keying, Phase interferometry, Phase measurement, Phase shifts, Fizeau interferometers

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Mathematical modeling, Optical imaging, Light sources, Metrology, Data modeling, Imaging systems, Interferometers, Calibration, Error analysis, Geometrical optics, Freeform optics, Spherical lenses, Systems modeling

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Monochromatic aberrations, Coherence imaging, Axicons, Imaging systems, Spatial frequencies, Interferometers, Cameras, Error analysis, Interferometry, Optical testing, Computer generated holography, Zernike polynomials, Spherical lenses

Showing 5 of 51 publications
Conference Committee Involvement (1)
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
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