Dr. Robert F. Berg
at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 13 March 2015 Paper
Soichi Inoue, Eishi Shiobara, Takeshi Sasami, Isamu Takagi, Yukiko Kikuchi, Toru Fujimori, Shinya Minegishi, Robert Berg, Thomas Lucatorto, Shannon Hill, Charles Tarrio, Ivan Pollentier, Yen-Chih Lin, Yu-Jen Fan, Dominic Ashworth
Proceedings Volume 9422, 942212 (2015) https://doi.org/10.1117/12.2085700
KEYWORDS: Semiconducting wafers, Contamination, Picosecond phenomena, Temperature metrology, Extreme ultraviolet, Molecules, Extreme ultraviolet lithography, Electron beams, Standards development, Lithography

Proceedings Article | 1 April 2013 Paper
Proceedings Volume 8679, 867920 (2013) https://doi.org/10.1117/12.2011663
KEYWORDS: Semiconducting wafers, Carbon, Extreme ultraviolet, Contamination, Photoresist materials, Extreme ultraviolet lithography, Mirrors, Molecules, Manufacturing, Scanners

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