Dr. Robert D. Fiete
Chief Technologist at Harris Corp
SPIE Involvement:
Publications Committee | Fellow status | Senior status | Symposium Committee | Conference Program Committee | Symposium Chair | Conference Co-Chair | Conference Chair | Author | Editor | Instructor
Area of Expertise:
Image Chain Modeling , Imaging System Design , Image Processing
Publications (16)

SPIE Journal Paper | January 2, 2017
OE Vol. 56 Issue 01
KEYWORDS: Signal to noise ratio, Sensors, Sensor performance, Image quality, Modulation transfer functions, Quantum efficiency, Remote sensing, Optical engineering, Photography, Electro optical modeling

SPIE Journal Paper | July 1, 2015
MGSP Vol. 10 Issue 03

Proc. SPIE. 9483, Terahertz Physics, Devices, and Systems IX: Advanced Applications in Industry and Defense
KEYWORDS: Standoff detection, Imaging systems, Sensors, Interference (communication), Solids, Terahertz radiation, Antennas, CMOS technology, Raster graphics, Signal detection

SPIE Journal Paper | August 18, 2014
OE Vol. 53 Issue 08
KEYWORDS: Point spread functions, Optical transfer functions, Imaging systems, Sensors, Image quality, Cameras, Wavefronts, Mathematical modeling, Modulation transfer functions, Optical engineering

Proc. SPIE. 9102, Terahertz Physics, Devices, and Systems VIII: Advanced Applications in Industry and Defense
KEYWORDS: Optical design, CMOS sensors, Imaging systems, Sensors, Silicon, Imaging spectroscopy, Near field, Terahertz radiation, Antennas, Field effect transistors

Proc. SPIE. 8716, Terahertz Physics, Devices, and Systems VII: Advanced Applications in Industry and Defense
KEYWORDS: Staring arrays, Signal to noise ratio, Plasmonics, CMOS sensors, Imaging systems, Sensors, Terahertz radiation, Antennas, Signal detection, Systems modeling

Showing 5 of 16 publications
Conference Committee Involvement (15)
SPIE Defense + Commercial Sensing
14 April 2019 | Baltimore, United States
Imaging Spectrometry XXII: Applications, Sensors, and Processing
20 August 2018 | San Diego, California, United States
SPIE Commercial + Scientific Sensing and Imaging
15 April 2018 | Orlando, United States
SPIE Commercial + Scientific Sensing and Imaging
9 April 2017 | Anaheim, United States
Image Quality and System Performance XII
10 February 2015 | San Francisco, California, United States
Showing 5 of 15 published special sections
Course Instructor
SC959: Image Chain Modeling of Digital Camera Systems
Image chain modeling has become an important systems engineering tool for assessing the design of imaging systems. By mathematically modeling the image formation process of the entire imaging chain, from the radiometric source to the delivered image data, various imaging system designs can be studied and analyzed to optimize the image quality and assure that the final system design will meet the user's requirements. Images can be created and evaluated from the camera design before the camera is built, thus preventing costly redesigns after hardware has been purchased and integrated. This course presents an overview of the image chain models for digital imaging systems and the application of the models to quantify image quality differences between various design concepts. A discussion of the key elements of an imaging chain will be presented with discussion of the mathematical tools, such as linear systems math, used to model the imaging chain.
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