Mr. Robert Grosche
at Ruhr-Univ Bochum
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Target detection, Signal to noise ratio, Data modeling, Modulation, Sensors, Error analysis, Data acquisition, Distance measurement, Technetium, Stochastic processes

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